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Automotive
Materials Analysis
Electrical
Thermal
Optical
Lifetime Prediction

Reliability Testing
Test Performed
Electrical
Thermal
Optical
Lifetime Prediction
Environmental
Altitude
Mechanical

Test Standards
JEDEC, MilStd and Tecordia

HTOL       HALT       HASS
Failure Analysis
Typical Failure Mode
Short, open, ESD, EOS, leakage, and package broken

Failure Analysis Tools
SEM
OBIRCH
X-ray
FIB
Decap/X-section/P-lap

Reverse Engineering
Test Performed
Block identification, chip/pad dimensions, IO pads, technology node, memory block size, memory type, metal structure and material, package layer, bump-pitch/pad, pin connection configuration and mapping, solder ball/pad, ubm size, and Via

Decapsulation
Delayering
Polishing
Ion-Milling
Key Technology #1
Test Requirements for
Automotive Electronics


Delamination inspection for mounted part
Reliability test for PCB
Inspection of solder joint
Reliability tests for Pb-free soldering
Highly accelerated life test
Environmental tests for electronic equipment
Key Technology #2
Zero Defect Guideline


Functional Safety Program for Automotive ICs
Providing measurements to achieve the zero defect and ensure safety requirement throughout entire product life cycle
Key Technology #3
Automotive Electronics Qualification – AEC Standards
ISO26262


There is increasing demand for certification test to meet AEC standards due to the increasing demand for high standard in semiconductor reliability testing. However, it is not easy to find a laboratory, locally or abroad, that can provide all the tests defined in each standard. Outermost Technology has been diligently working with its partners to build this extensive set of tests and is now able to cover all the test of the AEC standards.
Key Technology #4
Radiation Effect and Soft Error Test
Acceleration Radiation Test
Fast and thermal-neutron, heavy ion, proton, Alpha and muon particles, Gamma and X-ray
Material/Parts Analysis
Ultra low alpha particles counting, total ionizing dose effect testing, soft error rate testing, single event latch-up testing, SEFI test and analysis, TID effect test
SEU Analysis S/W Tools
T-FIT, SoC-FIT, T-FIT and SoC-TIT analysis service
Standard Qualification
JEDEC, AEC-Q200, ISO26262
SEU Mitigation and Analysis
SEU/SEL failure analysis, Transistor/Cell level fault simulation, technology, design, and system level hardening, design and system level reliability management solutions, cross-layer reliability analysis and exchanges
Key Technology #5
Test Items for Automotive
Electronics – Electrical and Temperature
High/Low temperature operation and storage
High temperature and humidity operation and storage
Temperature cycle operation and storage
Highly Accelerated Life Test (HALT)
Electrical characteristic verification
Key Technology #6
Test Items for Automotive Electronics
- Mechanic
Drop
Shock
Random vibration
Resonance frequency durability
Vibration endurance with complex environment
Key Technology #7
Test Items for Automotive Electronics
- Environment
Dust/UV
Condensation
Water/Liquid/Resistance
Salt Atmosphere
Mixed Gas Corrosion
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