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Atomic Force Microscope (AFM)/ Scanning Capacitance Microscopy (SCM)/ Magnetic Force Microscopy (MFM)/ Conductive AFM/ Tunneling AFM (TUNA)

Equipment: Park System NX 10 Atomic Force Microscope

Working Principle

A candilever with a sharp tip scans over a sample surface collecting various information depending on the type of interactions it uses between the tip and the surface.

Technical Information

AFM Images

SCM Images

MFM Images

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