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Electron Backscatter Diffraction (EBSD)

Equipment: Oxford Instrument-Aztec

Working Principle

  • Accelerated electrons in the primary beam of a scanning electron microscope (SEM) can be diffracted by atomic layers in crystalline materials
  • The diffracted electrons can be detected when they impinge on a phosphor screen and generate visible lines, called Kikuchi bands, or "EBSD" (Electron Backscatter Deffraction)

Technical Information

  • Fastest and most reliable way to acquire data for crystalline structure and orientation in a solid crystalline phase
  • Acquire data for phases of all symmetries and for opaque phases
  • The data give true 3-dimensional orientations for individual crystals

ESD Image Used to Analyze Additive Manufacturing in Titanium

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