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Low Temperature Storage Test (LTST)

Equipment: Micro Control Company HPB-5S

Working Principle

  • Devices are subject to continuous storage in a chamber with circulating cold air to -65 °C
  • No electrical stress applied
  • The test may be destructive, depending on time, temperature and packaging
  • 96, 500, 1000, or 2000 hours, -65 °C
  • Standard: JESD22-A103C

Technical Information

  • Check the capacity retention
  • Obtain data to evaluate materiel safety, integrity, and performance during operation
  • Evaluate materials in a low temperature environment during the device life cycle

LTST, Device in Cold Condition

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