Low Temperature Storage Test (LTST)
Equipment: Micro Control Company HPB-5S
Working Principle
- Devices are subject to continuous storage in a chamber with circulating cold air to -65 °C
- No electrical stress applied
- The test may be destructive, depending on time, temperature and packaging
- 96, 500, 1000, or 2000 hours, -65 °C
- Standard: JESD22-A103C
Technical Information
- Check the capacity retention
- Obtain data to evaluate materiel safety, integrity, and performance during operation
- Evaluate materials in a low temperature environment during the device life cycle
LTST, Device in Cold Condition