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Non-Volatile Memory (Flash) Testing

Equipment: Neosem, SX4A-t

Working Principle

Memory cells arranged in rows and columns
  • Each memory cell comprising a transistor and a select transistor
  • Tests are driven by software and that will unlock the NVM inside individual servers
  • Software can be selected from libraries
  • Standard: PCIe (Peripheral Component Interconnect express)

Technical Information

  • The data will help users to prepare data center
  • Obtain written endurance
  • Obtain read/write latency
  • Measure leakage power

LED Factors for Current Density

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