By using our website, you accept our use of cookies.

View Privacy Policy

Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Equipment: CAMECA IMS 7F-Auto

Working Principle

When a solid surface is sputtered by primary ions of few keV energy, a fraction of the particles emitted from the target which includes some ions. The detector analyzed those ions to collect composition and structural information with extremely high sensitivity.

Technical Information

Depth Profile Example

Request A Quote

Thank you!
Your message has been sent.
We'll get back to you as soon as possible.

Last Updated: February 17, 2020
Privacy Policy Privacy Policy (EU) Terms of Service
© Copyright 2020 Outermost Technology, LLC. All rights reserved.