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Electrical Overstress Test (EOS)

Equipment: EOS Test System HANWA, HED-C5000

Working Principle

  • Apply voltage onto DUT and ensure it can carry enough power and heat
  • Measure the current to understand the maximum current and heat the DUT is acceptable
  • ~150V Absolute minimum
  • Standard: JDSD 74A

Technical Information

  • Find where the eOS can possibly happen
  • Observe the large area and time last when EOS occurs
  • Avoid fast voltage transients and hot plug
  • Protect RF power and prevent IC failure in circuits and systems

Transistor Failure Caused by Electrical Overstress Damage Across the Die

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Last Updated: February 17, 2020
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