By using our website, you accept our use of cookies.

View Privacy Policy

High Temperature Forward Bias (HTFB) Test

Equipment: Thermal Chamber-MSK-1050PR

Working Principle

  • The polarity of the voltage dropped across the diode
  • High temperature and forward bias stress the DUT
  • Forward voltage for a diode varies slightly for changes in forward current and temperature
  • 150 °C
  • Standard: JESD108D

Technical Information

  • Temperature variation effects on current of Schottky diode
  • Measure barrier height and electron mobility
  • Draw a comprehensive IV curve

IV Curve of Forward/Reverse Bias

Request A Quote

Thank you!
Your message has been sent.
We'll get back to you as soon as possible.

Last Updated: February 17, 2020
Privacy Policy Privacy Policy (EU) Terms of Service
© Copyright 2020 Outermost Technology, LLC. All rights reserved.