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High Temperature Reverse Bias (HTRB) Test

Equipment: HTRB Test System

Working Principle

  • High temperature and reverse bias stress the DUT
  • The devices are normally operated in a static mode or near the maximum oxide breakdown voltage levels
  • The bias condition bias the maximum number of junctions in the device
  • 150 °C
  • Standard: JESD22-A108D

Technical Information

  • Specified device parameters are evaluated as the drain-source voltage moves from low to high
  • Tune the design and process conditions
  • Verify that devices deliver the performance specified on their data sheets

Current Density Changes and the Voltage Between Drain and Source

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Last Updated: February 17, 2020
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