By using our website, you accept our use of cookies.

View Privacy Policy
OBIRCH

Equipment: Hamatsu Phomos 2000

Working Principle

  • An IR laser beam scans the DUT
  • Use resistance change to distinguish the defects
  • Color highlights the areas containing defects

Technical Information

  • Isolate the fault
  • Locate shorts, opens, hot spots and defects on circuitry
  • Perform FA from frontside or backside (silicon surface)
  • A very quick and powerful FA tool

Location of Defects

Request A Quote

Thank you!
Your message has been sent.
We'll get back to you as soon as possible.

Privacy Policy Privacy Policy (EU) Terms of Service
© Copyright 2019 Outermost Technology, LLC. All rights reserved.