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Picosecond Imaging for Circuit Analysis (PICA)

Equipment: PICA NxQ

Working Principle

  • Laser optical imaging technique combining imaging with timing
  • Resolve individual devices at the 0.5 micron level
  • Switching events on a 10 picosecond timescale

Technical Information

  • Diagnostic results of failures on CMOS
  • Effective backside analysis
  • A clear look at poly, well, source, drain, and gate

Research Performed on a Note of CMOS Driver

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Last Updated: February 17, 2020
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