Picosecond Imaging for Circuit Analysis (PICA)
Equipment: PICA NxQ
Working Principle
- Laser optical imaging technique combining imaging with timing
- Resolve individual devices at the 0.5 micron level
- Switching events on a 10 picosecond timescale
Technical Information
- Diagnostic results of failures on CMOS
- Effective backside analysis
- A clear look at poly, well, source, drain, and gate
Research Performed on a Note of CMOS Driver