By using our website, you accept our use of cookies.

View Privacy Policy
Spectroscopic Ellipsometer (SE)

Equipment: J.A. Woollam RC2

Working Principle

Ellipsometer is an optical technique for investigating the dielectric properties of thin films. It measures the change of polarization upon reflection ro transmission and compares it to a model.

Technical Information

  • Composition
  • Roughness
  • Thickness
  • Crystallinity
  • Doping concentration
  • Electrical conductivity
  • Material properties of a thin film or a film stack

SE Data

Request A Quote

Thank you!
Your message has been sent.
We'll get back to you as soon as possible.

Privacy Policy Privacy Policy (EU) Terms of Service
© Copyright 2019 Outermost Technology, LLC. All rights reserved.